A Reliable Cornerstone for Gas Micro-Contamination Monitoring

In the gas micro-contamination monitoring system, based on the excellent performance of Baoshili Ultra-Clean PFA Tube, the solution can:

1. Ensure data accuracy: Realize lossless transmission of the gas to be tested from the sampling point to the analytical instrument, providing true and complete samples for subsequent analysis.
2. Improve system reliability: Reduce the frequency of system maintenance, calibration and failure rate caused by pipe issues, lowering the overall operating costs.
3. Empower advanced manufacturing processes: Meet the increasingly stringent requirements for environmental monitoring in advanced semiconductor manufacturing, and become a key support for ensuring chip yield and production safety.

Purity Assurance of Ultra-Clean PFA Tube

In the process of creating semiconductor-grade products, Baoshili has broken through key process technologies such as plasticization, extrusion, vacuum sizing, traction and winding, and dimensional control of ultra-clean PFA materials. Combined with ultra-pure material formulas and advanced high-temperature and corrosion-resistant precision equipment, it accurately controls key performance indicators of the pipes, such as dimensional tolerance, surface smoothness, corrosion resistance and metal ion leaching. Successfully developed semiconductor-grade Ultra-Clean PFA Tube, the product has three core advantages:

1. Excellent Chemical Stability

2. Extremely Low Metal Ion Leaching Rate

3. Wide Temperature Adaptability

Its wide temperature resistance allows it to adapt to various harsh environmental conditions in semiconductor factories, maintaining stable performance under different working conditions. Currently, with the deepening application of Baoshili Ultra-Clean PFA Tube in gas monitoring system solutions, its application scenarios and technical boundaries are constantly expanding. In the future, Baoshili will further upgrade its product capabilities to provide solid support for the innovation of next-generation semiconductor technologies.